Calculation of ellipsometric parameters of reflected circularly polarized light from a dielectric film under surface plasmon resonance conditions

Abstract

Currently, there is an active study of nanotechnology and nanomaterials for a deeper understanding of the possibilities of their use in various fields of scientific and research activities. In particular, nanocomposites are used in micro- and nanoelectronics and optics. That is why it is so important to study the optical properties of such materials.
The use of circularly polarized light for the diagnosis of thin films allows us to obtain additional information about its optical properties. The method of surface plasmon resonance spectroscopy is extremely informative due to the sharp resonance peaks in the reflected signal.
In this paper, we consider the use of nanocomposite to analyze the optical properties of dielectric materials by surface plasmon resonance spectroscopy. The nanocomposite is formed by a dielectric matrix with silver nanoparticles distributed in it. At its boundary, when considering the Kretschmann geometry, surface plasmons are excited, forming the basis of the method. The structure under study consists of a dielectric prism, a thin layer of nanocomposite that plays the role of a surface-active medium, as well as the layer under study. Circularly polarized light was used as probing radiation.
The method of reflective ellipsometry was used to determine the ellipsometric parameters. The amplitude reflection coefficients for s- and p-polarizations were calculated.
The results of the work concluded that the surface plasmon resonance spectroscopy method functions for the purposes of non-destructive testing of optical parameters of thin dielectric films.

Speaker

Ivanov Peter Sergeevich
Volgograd State University
Russian Federation

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